一种基于C单元的三节点翻转自恢复锁存器

计算机工程与科学 ›› 2024, Vol. 46 ›› Issue (1): 37-45.

一种基于C单元的三节点翻转自恢复锁存器

徐辉1,朱烁1,孙皓洁1,马瑞君1,梁华国2,黄正峰2

（1.安徽理工大学计算机科学与工程学院，安徽淮南 232001；
2.合肥工业大学微电子学院，安徽合肥 230009)

收稿日期:2022-11-29 修回日期:2023-05-01 出版日期:2024-01-25 发布日期:2024-01-15
基金资助:
国家自然科学基金(61834006,61874156,61404001);国家重大科研仪器研制项目(62027815)

A triple-node-upset self-recovery latch using C-element

XU Hui1,ZHU Shuo1,SUN Hao-jie1,MA Rui-jun1,LIANG Hua-guo2,HUANG Zheng-feng2

(1.School of Computer Science and Engineering,Anhui University of Science and Technology,Huainan 232001;
2.School of Microelectronics,Hefei University of Technology,Hefei 230009,China)

Received:2022-11-29 Revised:2023-05-01 Online:2024-01-25 Published:2024-01-15

摘要/Abstract

摘要： 随着集成电路中工艺尺寸的不断缩减，锁存器也越来越容易受到粒子辐射引起的三节点翻转的影响。针对该问题，基于C单元的结构，提出一种低功耗、低延时和高鲁棒性的三节点翻转并自恢复的MKEEP锁存器。通过仿真实验和PVT的波动实验表明，相对于其他拥有三节点容忍或自恢复能力的锁存器，该锁存器拥有低功耗、低延迟和更小的面积开销，且对工艺、电压和温度的敏感度较低，优势明显。

关键词: 粒子辐射, 三节点翻转, 锁存器, 自恢复

Abstract: With the persistent reduction of process size in integrated circuits, latches are also more and more vulnerable to the influence of triple-node-upset caused by particles radiation. Aiming at this problem, a triple-node-upset tolerance and self-recovery MKEEP latch based on C-element with low power consumption, low delay and high robustness is proposed. Simulation experiments and PVT fluctuation experiments show that, compared with other latches with triple-node-upset tolerance or self- recovery capability, the proposed latch has lower power consumption, low delay and area overhead. At the same time, this latch is less sensitive to process, voltage and temperature, and has obvious advan- tages than referenced latches.

Key words: particles radiation, triple-node-upset, latch, self-recovery

中图分类号:

徐辉, 朱烁, 孙皓洁, 马瑞君, 梁华国, 黄正峰. 一种基于C单元的三节点翻转自恢复锁存器[J]. 计算机工程与科学, 2024, 46(1): 37-45.

XU Hui, ZHU Shuo, SUN Hao-jie, MA Rui-jun, LIANG Hua-guo, HUANG Zheng-feng. A triple-node-upset self-recovery latch using C-element[J]. Computer Engineering & Science, 2024, 46(1): 37-45.