栅氧退化效应下纳米级SRAM单元临界电荷分析

金作霖，张民选，孙岩，石文强

Analysis of the impact of gateoxide degradation on
nanoscale SRAM cell’s critical charge

JIN Zuolin,ZHANG Minxuan,SUN Yan,SHI Wenqiang

计算机工程与科学 . 2013, (8): 20 -24 .