关键词: 伪随机激励 泰勒展式 特征空间 互相关函数

Abstract:

This paper presents a simple and efficient testing scheme for analog and mixed-signal circuits. We use the Taylor expansion to analyze the signature s pace, which is obtained from calculating the input-output cross-correlation of the DUT（Device Under Testing）, to get the delay time of signature-pair. . This method can improve the efficiency and accuracy of the analog and mixed-signal circuit testing

Key words: （pseudo-random stimulus, Taylor expansion, signature space, cross-correlation function）