VLSI系统级软错误可靠性评价：综述

J4 ›› 2013, Vol. 35 ›› Issue (3): 15-24.

VLSI系统级软错误可靠性评价：综述

朱丹,李暾,李思昆

(国防科学技术大学计算机学院，湖南长沙 410073)

收稿日期:2010-08-06 修回日期:2010-10-30 出版日期:2013-03-25 发布日期:2013-03-25
基金资助:
国家自然科学基金资助项目(60906009,60773025)；长江学者与创新团队发展计划资助项目

VLSI systemlevel soft error reliability evaluation:A survey

ZHU Dan,LI Tun,LI Sikun

(School of Computer Science,National University of Defense Technology,Changsha 410073,China)

Received:2010-08-06 Revised:2010-10-30 Online:2013-03-25 Published:2013-03-25

摘要/Abstract

摘要：

由空间辐射、噪声干扰等环境问题引发的软错误给VLSI设计可靠性带来了严峻挑战。由于目前的软错误保护机制通常都基于冗余，因此，对电路进行完全的软错误保护需要的容错代价十分高昂，只能对设计进行有选择性的保护。软错误可靠性分析是有选择性保护的关键。为了在同时满足多种设计目标的前提下有效部署容错机制，平衡可靠性需求与容错开销，软错误系统级可靠性评价至关重要。按照核心技术的不同，本文对已有的软错误系统级可靠性评价方法进行分类及介绍，并详细分析了各类方法的进展和优缺点，总结了已有方法存在的问题和面临的挑战，指出了未来的发展方向。

关键词: 软错误保护, 可靠性分评价

Abstract:

The soft error induced by various environment problems,such as radiation and random noise,has emerged as a critical challenge in VLSI designs.Since most of the methods for soft error protection are based on redundancy,the cost of full soft error protection is unacceptable.Thus,the designs can only be selectively protected.The soft error reliability evaluation is the key of selective protection.In order to make costeffective tradeoff between reliability and various overhead from hardening,the soft error reliability evaluation at system level is crucial.The paper firstly classifies the existing systemlevel soft error reliability evaluation approaches by their core techniques;secondly discusses their development and features;finally proposes their remained difficult issues and challenges and predicts their future trends.

Key words: soft error protection;reliability evaluation

朱丹,李暾,李思昆. VLSI系统级软错误可靠性评价：综述[J]. J4, 2013, 35(3): 15-24.

ZHU Dan,LI Tun,LI Sikun. VLSI systemlevel soft error reliability evaluation:A survey[J]. J4, 2013, 35(3): 15-24.