The digital microfluidic chip (DMFC) is widely used in safety-critical biomedical applications, which has very high requirement for reliability.
Due to the reconfigurability of the DMFC, when the number of faults is less than a certain ratio, electrode arrays can skip the faulty units and be reused after
they are reconfigurated, which are called reconfigurated microchips. The irregular electrode units of the reconfigurated microchip should be robustly and completely tested to avoid any bioassay errors. We propose parallel testing on irregular electrode units after reconfiguration for the first time. The reconfigurated electrode array is divided into multiple sub-arrays with the same size. each sub-array is allocated with a test droplet for parallel test to minimize test time. The timeminimizing problem is converted to a distribution problem of test source pool, and an ILP model is designed for this NP-complete problem to achieve minimal test time. Experimental results show that the proposal avoids repeated diagnosis of faults, minimizes test time for the reconfigurated microchip after faults, and achieves a good test effect.