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YU Jia-wei,BEN Ke-rong
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Key words: extended finite state machine (EFSM), regression testing, ALL-Uses, dependence analysis
YU Jia-wei,BEN Ke-rong.
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URL: http://joces.nudt.edu.cn/EN/
http://joces.nudt.edu.cn/EN/Y2017/V39/I12/2278