Abstract: With the persistent reduction of process size in integrated circuits, latches are also more and more vulnerable to the influence of triple-node-upset caused by particles radiation. Aiming at this problem, a triple-node-upset tolerance and self-recovery MKEEP latch based on C-element with low power consumption, low delay and high robustness is proposed. Simulation experiments and PVT fluctuation experiments show that, compared with other latches with triple-node-upset tolerance or self- recovery capability, the proposed latch has lower power consumption, low delay and area overhead. At the same time, this latch is less sensitive to process, voltage and temperature, and has obvious advan- tages than referenced latches.

Key words: particles radiation, triple-node-upset, latch, self-recovery