• 中国计算机学会会刊
  • 中国科技核心期刊
  • 中文核心期刊
论文

Research on the Graph Label Based Test Information Description Technique

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  • (Department of Information Engineering,Academy of Armored Force Engineering,Beijing 100072,China)

Received date: 2010-03-12

  Revised date: 2010-06-14

  Online published: 2010-09-02

Abstract

This paper analyzes the methods commonly used to describe the  testing information in graphical automatic test systems,introduces briefly the architecture of the graphlabel based automatic test platform. Then,it defines several languages by the XML schema to describe the testing design,including hardware environment design,flowchart of the testing program,as well as the input/output data of a test. It defines a graph marked language for describing the  interface information of the test,and testing the marked language for describing parameters,programs and  data. In this way the design of a  test and the testing program are loosely related. It can exchange data with other systems and can be generalized and updated easily.

Cite this article

LIU Haiyan,ZHANG Zhanjun,YANG Jiankang . Research on the Graph Label Based Test Information Description Technique[J]. Computer Engineering & Science, 2010 , 32(9) : 73 -75 . DOI: 10.3969/j.issn.1007130X.2010.

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