• 中国计算机学会会刊
  • 中国科技核心期刊
  • 中文核心期刊
Analysis of the impact of gateoxide degradation on
nanoscale SRAM cell’s critical charge        
JIN Zuolin,ZHANG Minxuan,SUN Yan,SHI Wenqiang
Computer Engineering & Science . 2013, (8): 20 -24 .