Effect of channel width and length shrinking on <br /> hot carrier effect in bulk and SOI nMOSFETs

中国计算机学会会刊
中国科技核心期刊
中文核心期刊

Home
Introduction
- Journal honors
- Database
Editorial board
Guide
Submission
Publishing ethics
Subscription
Download
Contact us
中文

Effect of channel width and length shrinking on
hot carrier effect in bulk and SOI nMOSFETs

CHI Yaqing1,2,LIU Rongrong1,CHEN Jianjun1

Computer Engineering & Science . 2014, (05): 786 -789 .