<div style="line-height: 150%">An optimization scheme for TSV-</div> <div style="line-height: 150%">based 3D-SIC test scheduling</div>

NIE Mu1,LIANG Hua-guo1,2,BIAN Jing-chang2,NI Tian-ming2,XU Xiu-min2,HUANG Zheng-feng2

Computer Engineering & Science . 2017, (03): 458 -463 .