J4 ›› 2014, Vol. 36 ›› Issue (03): 399-403.
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LI Jinwen,CAO Yuesheng,HU Jun,XIAO Liquan
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Abstract:
DDR3 memory has become one of the mainstream applications in current servers and computer systems. Although many techniques such as dual reference voltage, dynamic ondie termination (ODT), flyby topology and writeleveling, have been adopt by DDR3 in order to improve signal integrity in a certain extent, it is still difficult to design and realize high data rate. Since DDR3 is a typical parallel bus structure, the simultaneous switching noise is couped with the original power noise, affecting the quality of data signals. Taking into account that the chip current is a dynamic changing and frequency related source, the paper proposes a new mixed simulation and design procedure based on target impedance and dynamic target impedance. The constant target impedance is adopted in presimulation, while the dynamic target impedance is used in postsimulation. The tradeoff between speed and accuracy of design optimization is realized, and simulation results prove the feasibility and efficiency of this method.
Key words: DDR3 DIMM;power integrity(PI);dynamic target impedance
LI Jinwen,CAO Yuesheng,HU Jun,XIAO Liquan. Simulation on power integrity of DDR3 system based on dynamic target impedance [J]. J4, 2014, 36(03): 399-403.
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http://joces.nudt.edu.cn/EN/Y2014/V36/I03/399