• 中国计算机学会会刊
  • 中国科技核心期刊
  • 中文核心期刊

J4 ›› 2014, Vol. 36 ›› Issue (03): 399-403.

• 论文 • Previous Articles     Next Articles

Simulation on power integrity of DDR3 system
based on dynamic target impedance               

LI Jinwen,CAO Yuesheng,HU Jun,XIAO Liquan   

  1. (College of Computer,National University of Defense Technology,Changsha 410073,China)
  • Received:2013-10-15 Revised:2013-12-25 Online:2014-03-25 Published:2014-03-25

Abstract:

DDR3 memory has become one of the mainstream applications in current servers and computer systems. Although many techniques such as dual reference voltage, dynamic ondie termination (ODT), flyby topology and writeleveling, have been adopt by DDR3 in order to improve signal integrity in a certain extent, it is still difficult to design and realize high data rate. Since DDR3 is a typical parallel bus structure, the simultaneous switching noise is couped with the original power noise, affecting the quality of data signals. Taking into account that the chip current is a dynamic changing and frequency related source, the paper proposes a new mixed simulation and design procedure based on target impedance and dynamic target impedance. The constant target impedance is adopted in presimulation, while the dynamic target impedance is used in postsimulation. The tradeoff between speed and accuracy of design optimization is realized, and simulation results prove the feasibility and efficiency of this method.

Key words: DDR3 DIMM;power integrity(PI);dynamic target impedance