Abstract:

In the field of integrated circuit (IC) testing, Time Propagation Delay (tPD) is a very important parameter, which not only reflect the response speed of the integrated circuit, but also influences the measurement accuracy of alternating current (AC) parameters in the IC testing system.We analyze the causes of tPD in the IC test system in detail, and study the influence on the testing results of  alternating current parameters of the device under test.We propose a measuring method of the digital channel tPD in the IC test system based on the time domain reflection technology,and conduct an experiment in Teradyne’s J750EX system. Through the analysis of experimental data, we find this method can effectively measure the digital channel’s  tPD,and hence improve the measurement accuracy of the AC parameters in the IC testing system. 

Key words: time propagation delay;time domain reflection measurement;IC test system;digital channel