Computer Engineering & Science
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HUI Zi-qing,LIU Xiao-yan,YAN Xin
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Key words: software reliability, software reliability growth model, fault-correction waiting delay, generalized dynamic integration network
HUI Zi-qing,LIU Xiao-yan,YAN Xin.
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URL: http://joces.nudt.edu.cn/EN/
http://joces.nudt.edu.cn/EN/Y2020/V42/I04/641