• 中国计算机学会会刊
  • 中国科技核心期刊
  • 中文核心期刊

Computer Engineering & Science ›› 2023, Vol. 45 ›› Issue (08): 1443-1452.

• Graphics and Images • Previous Articles     Next Articles

Research on bimodal SAXS image structure characterization technique

GU Wen-jun1,2,ZHANG Sheng-kai3,QIU Xiao-meng1,2,LI Ya-kang4,SONG Wei1   

  1. (1.Henan Academy of Big Data,Zhengzhou University,Zhengzhou 450052;
    2.School of Computer and Artificial Intelligence,Zhengzhou University,Zhengzhou 450001;
    3.Institute of Advanced Science Facilities,Shenzhen 518107;
    4.Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China)
  • Received:2022-09-15 Revised:2022-10-20 Accepted:2023-08-25 Online:2023-08-25 Published:2023-08-18

Abstract: The continuous upgrading and development of small-angle X-ray scattering (SAXS) equipment have generated more high-dimensional scattering data, which poses great challenges for researchers to quickly obtain experimental results. Researchers urgently need effective automated classification methods to speed up data representation and obtain higher accuracy. However, many models learn features mainly for illumination images, ignoring the characteristics of scattering images and resulting in lower classification accuracy. Therefore, based on the characteristics of scattering patterns, this paper proposes a bimodal fine-grained feature extraction model called BRTNet. The model adopts a bimodal input mode. The first mode is the feature learning network PRS using a multi-scale convolution architecture, which learns the micro-information of scattering images. The second mode is the multi-head attention mechanism ConvTransformer fusing local information, which learns the correlation information of scattering sequences. Then, the model combines image information and sequence information, fuses the dual-branch features, classifies the scattering data, and obtains the classification results. Experimental results on the biological solution scattering dataset show that the model's classification accuracy exceeds 89%, which has a significant advantage over the baseline model.  

Key words: small-angle scattering image, fine-grained classification, scattering features, bimodal