J4 ›› 2012, Vol. 34 ›› Issue (4): 23-27.
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LUO Xiangdong,ZHAI Xianzhen,DAI Shanshan,YU Chenhui,LIU Peisheng
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Abstract:
A LDMOS structure with the Gaussshape surface in the drift region is proposed here. Pwell, channel, source region, polysilicon gate are set on one side of the Gauss center, and the drain region is put on the other side of the Gauss center. This LDMOS structure has high breakdown voltage of the LDMOS with a gradient surface in the drift region, but also has high onstate breakdown voltage and safe operating area. By changing the height factor of the Gauss shape of the drift region, the drift region with the Gaussshape surface is studied. The results indicate that high temperature drivein of pwell changes the net doping of the drift region with different Gaussshape surfaces. The device breakdown voltage and the surface electric field profile of the LDMOS structures with different Gaussshape surfaces are investigated by changing the height factor of the Gauss shape. There has an optimized onstate breakdown voltage and a smooth surface electric profile when the height factor is around 0.5. Meanwhile, when the height factor increases from 0.5 to 1.0, the onstate breakdown voltage is saturated.
Key words: LDMOS;Gaussshape surface;drift region;onstate breakdown voltage;surface electric field
LUO Xiangdong,ZHAI Xianzhen,DAI Shanshan,YU Chenhui,LIU Peisheng. Device Characteristics of LDMOS with the GaussShape Surface in the Drift Region[J]. J4, 2012, 34(4): 23-27.
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http://joces.nudt.edu.cn/EN/Y2012/V34/I4/23