Abstract:

To address the problem of the shortcoming of the don’t case bits (Xs) filling algorithm in EFDR coding technique,a novel EFDRbased X-filling algorithm (ESA) is proposed. According to the coding characteristic of EFDR,the proposed X-filling algorithm fills the don’t care bits in all 0s,all 1s or blockpartitioned filling based on the properties of the runs of don’t care bits and the specified bits on both sides of don’t care bits. The proposed ESA algorithm can achieve higher test compression effect of EFDR and decrease the test application time. Simultaneously, it will not affect the test hardware overhead and test power dissipation of EFDR since the proposed X-filling algorithm only fills the don’t care bits in the test sets as other X-filling techniques.Experimental results demonstrate the effectiveness of the proposed technique.

Key words: X-filling;test data compression;EFDR