Abstract:

In Built-In Self-Test (BIST), the fault coverage of traditional test generation is too low, and the hardware overhead is too large. To tackle these disadvantages, a multi-configurable LFSR structure of hybrid test vector generation is proposed. In the structure, matrix theory is used to configure the feedback network for random vectors and deterministic vectors. For the deterministic vector generation, an optimization algorithm of feedback configuration solution is proposed so as to reduce hardware overhead. The hybrid test vectors generated by the structure can ensure the test fault coverage, which can detect random pattern detectable faults and random pattern resistant faults in circuit under test. At last, some examples and several synthesized reference circuits are used to verify the feasibility of our proposal.

Key words: BIST;hybrid test vectors;multi-configurable LFSR;configuration vectors optimization